• DocumentCode
    2083268
  • Title

    Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family

  • Author

    Poivey, C. ; Grandjean, M. ; Guerre, F.-X.

  • Author_Institution
    ESA ESTEC, Noordwijk, Netherlands
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We present radiation data, Heavy ion and proton induced Single Event Effects (SEE) and Total Ionizing Dose (TID), on the Microsemi ProASIC3 Flash Field Programmable Gate Array (FPGA) A3PE3000L. These tests have been performed in the frame of an European Space Agency (ESA) Technology Research Program (TRP).
  • Keywords
    application specific integrated circuits; field programmable gate arrays; radiation effects; field programmable gate array; microsemi ProASIC3 flash FPGA family; radiation characterization; single event effects; total ionizing dose; Clocks; Degradation; Flip-flops; Inverters; Phase locked loops; Radiation effects; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062510
  • Filename
    6062510
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083268