• DocumentCode
    2083468
  • Title

    Efficient analysis of imperfect coverage systems with functional dependence

  • Author

    Xing, Liudong ; Morrissette, Brock A. ; Dugan, Joanne Bechta

  • Author_Institution
    Univ. of Massachusetts - Dartmouth, MA, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Traditional approaches to handling functional dependence in systems with imperfect fault coverage are based on Markov models, which are inefficient due to the well-known state space explosion problem. Also, the Markov-based methods typically assume exponential time-to-failure distributions for the system components. In this paper we propose a new combinatorial approach to handling functional dependence in the reliability analysis of imperfect coverage systems. Based on the total probability theorem and the divide-and-conquer strategy, the approach separates the effects of functional dependence and imperfect fault coverage from the combinatorics of the system solution. The proposed approach is efficient, accurate, and has no limitation on the type of time-to-failure distributions for the system components. The application and advantages of the proposed approach are illustrated through analyses of two examples.
  • Keywords
    Markov processes; combinatorial mathematics; divide and conquer methods; reliability theory; state-space methods; statistical distributions; Markov model; divide-and-conquer strategy; functional dependence; imperfect coverage systems; reliability analysis; state space explosion problem; time-to-failure distribution; total probability theorem; Aerodynamics; Application software; Combinatorial mathematics; Computer peripherals; Explosions; Failure analysis; Fault trees; Nuclear power generation; Redundancy; State-space methods; combinatorial method; functional dependence; imperfect fault coverage; reliability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5447994
  • Filename
    5447994