• DocumentCode
    2083874
  • Title

    Radiation and Reliability Characterization of a Multiplexer Family Using a 0.35µm Triple-Well CMOS Technology

  • Author

    Wilson, A. ; Kerwin, D. ; Richardson, T. ; Ton, Q. ; Merkel, K. ; Koziuk, G. ; Hafer, C.

  • Author_Institution
    Aeroflex Colorado Springs, Colorado Springs, CO, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    A 16:1 analog multiplexer has been designed, manufactured, and characterized for radiation effects and lifetime operation. The device is SEL immune, hardened to 300 krad(Si) TID, and SEU immune up to 62.3 MeV-cm-2/mg. The TID, SEE and lifetime operation performance is reported.
  • Keywords
    CMOS integrated circuits; multiplexing equipment; radiation effects; reliability; analog multiplexer; lifetime operation performance; radiation effects; reliability; size 0.35 mum; triple-well CMOS technology; Logic gates; MOS devices; Multiplexing; Single event upset; Springs; Testing; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062537
  • Filename
    6062537
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083874