DocumentCode
2084338
Title
Experimental and numerical study of underfill encapsulation of flip-chips using conductive epoxy polymer bumps
Author
Ni, G. ; Gordon, M.H. ; Schmidt, W.F. ; Muyshondt, A.
Author_Institution
Dept. of Mech. Eng., Arkansas Univ., Fayetteville, AR, USA
fYear
1997
fDate
18-21 May 1997
Firstpage
859
Lastpage
865
Abstract
The flow of underfill encapsulant for epoxy bonded flip-chips is studied numerically and experimentally and compared to analytical predictions for fully developed 2-D flow. A 2-D VOF (volume of fluid) FLUENT model was used to explore the functional relationships between the gap size, the encapsulant´s viscosity and surface tension, and the flow rate. The computational intensiveness of this problem prevented direct comparisons between the numerical and experimental data. However, scaled results indicate that the numerical predictions are in general agreement with analytical predictions-the numerical flow times are proportional to the viscosity and to the square of the distance travelled, and inversely proportional to the gap height and the surface tension. The constant of proportionality, however, differs by up to 60% because the numerical (and experimental) flow is not fully developed near the encapsulant-air interface. Experiments at varying temperatures have allowed the inference of the encapsulant´s temperature dependent viscosity and an optimal temperature for the underfill process
Keywords
encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; polymers; surface tension; viscosity; 2D volume of fluid FLUENT model; IC interconnects; conductive epoxy polymer bumps; constant of proportionality; encapsulant-air interface; flip-chips; flow rate; gap size; surface tension; temperature dependent viscosity; underfill encapsulation; Bonding; Capacitive sensors; Encapsulation; Fatigue; Lead; Polymers; Production; Surface tension; Temperature dependence; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location
San Jose, CA
ISSN
0569-5503
Print_ISBN
0-7803-3857-X
Type
conf
DOI
10.1109/ECTC.1997.606270
Filename
606270
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