• DocumentCode
    2084436
  • Title

    Two recommendations for the acquisition and growth of reliable systems

  • Author

    Nicholls, David ; Lein, Paul

  • Author_Institution
    Reliability Inf. Anal. Center, Utica, NY, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents two recommendations for improving the acquisition and growth of reliable systems that support the intent of DoDI 5000.02 and ANSI/GEIA-STD-0009: 1. During the proposal evaluation and selection process, use a metric based on a Historical Observed Reliability Ratio (HOR-R, pronounced ¿horror¿) of the potential supplier´s predicted or assessed reliability measure to its observed field reliability value. 2. Extend the definition of reliability growth A-Mode and B-Mode failures to include classifications of ¿Unanticipated Failure Mode¿ and ¿Unexpected Failure Mode¿. These two recommendations, and the corrective actions they initiate, provide benchmarks to improve both the effectiveness of acquisitions in reliability and life cycle cost risk avoidance, and the ability of DFR activities to proactively identify and mitigate failure modes prior to their more costly discovery during testing or field use.
  • Keywords
    ANSI standards; failure analysis; life cycle costing; reliability; A-Mode failure; ANSI/GEIA-STD-0009; B-Mode failure; DoDI 5000.02; historical observed reliability ratio; life cycle cost risk avoidance; reliable system acquisition; reliable system growth; unanticipated failure mode; unexpected failure mode; ANSI standards; Availability; Costs; Information analysis; Job shop scheduling; Manufacturing; Proposals; Standards development; System testing; Time measurement; ANSI/GEIA-STD-0009; Acquisition; DoDI 5000.02; failure modes; reliability growth; reliability prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5448040
  • Filename
    5448040