DocumentCode
2084916
Title
Investigation on radiated EMI noise identification for high speed digital PCB
Author
Zhao Yang ; Wei, Yan ; Zhiming, Feng ; Luo Yongchao ; Shijin, Li ; Dong, Yre
Author_Institution
Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
fYear
2009
fDate
16-20 Sept. 2009
Firstpage
297
Lastpage
300
Abstract
In the paper, a new approach by using near-field probes is proposed to identify mechanism of radiated EMI noises, i.e. CM noise and DM noise, according to but only the internal relationship between radiated EM field and near-field wave impedance, but also the inner relationship between wave impedance and measurement distance. Then, radiated EMI noises decrease obviously after suppressed by using 3-m chamber measurement. The research shows that the proposed method is effective and valid.
Keywords
electromagnetic interference; printed circuits; CM noise; DM noise; EMI noise identification; chamber measurement; electromagnetic interference; high speed digital PCB; near-field probes; Automation; Delta modulation; Electric variables measurement; Electromagnetic interference; Impedance measurement; Magnetic field measurement; Magnetic moments; Millimeter wave technology; Noise measurement; Probes; Diagnosis; High speed digital PCB; Noise; Radiated EMI;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location
Xian
Print_ISBN
978-1-4244-4344-4
Type
conf
DOI
10.1109/CEEM.2009.5301477
Filename
5301477
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