• DocumentCode
    2086334
  • Title

    Correcting sample selection bias for image classification

  • Author

    Wu, Di ; Lin, Dinzhong ; Yao, Li ; Zhang, Wenjun

  • Author_Institution
    Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    1
  • fYear
    2008
  • fDate
    17-19 Nov. 2008
  • Firstpage
    1214
  • Lastpage
    1220
  • Abstract
    One of the basic assumptions in traditional machine learning is that it requires training and test data be under the same distribution. However, in image classification, this assumption often does not hold, since image labels are not as sufficient as text ones. In this paper, we propose to use labeled images from relevant but different categories to take the role of training data for estimating a prediction model. Correcting sample selection bias, the 2000 Nobel Prize work in Economic, is applied to our problem. We assume that the difference between training and test data is that they are governed by different distributions. By eliminative sample selection bias in the training data, the supervisory knowledge in the training data can be effectively learned for classifying images in the test set. We present theoretical and empirical analysis to demonstrate the effectiveness of our algorithm. The experimental results on two image corpora show that our algorithm can greatly improve several state-of-the-art classifiers when the training and test images come from similar but different categories.
  • Keywords
    estimation theory; image classification; image sampling; learning (artificial intelligence); prediction theory; data set test; data training; image classification; image label; machine learning; prediction model estimation; sample selection bias; supervisory knowledge; Image classification; Image communication; Intelligent systems; Knowledge engineering; Machine learning; Machine learning algorithms; Support vector machine classification; Support vector machines; Testing; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent System and Knowledge Engineering, 2008. ISKE 2008. 3rd International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-2196-1
  • Electronic_ISBN
    978-1-4244-2197-8
  • Type

    conf

  • DOI
    10.1109/ISKE.2008.4731115
  • Filename
    4731115