• DocumentCode
    2088369
  • Title

    Equivalence of physical optics and aperture field integration method in the full pattern analysis-effects of integration surface

  • Author

    Oodo, M. ; Ando, M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
  • Volume
    2
  • fYear
    1995
  • fDate
    18-23 June 1995
  • Firstpage
    889
  • Abstract
    The integration surface and the equivalent currents in aperture field integration method (AFIM) are numerically discussed in view of the equivalence of physical optics (PO) and AFIM. It was shown that provided we account for the lateral surface besides the projected aperture and we use the equivalent currents consisting of both the incident and geometrical optics (GO) reflected fields, PO and AFIM predict the equivalent-patterns in all the angular region. The roles of the incident and GO reflected fields in the definition of the equivalent currents are extracted.
  • Keywords
    antenna radiation patterns; electric current; electromagnetic fields; physical optics; reflector antennas; PO; angular region; aperture field integration method; equivalent currents; equivalent-patterns; full pattern analysis; incident fields; integration surface; lateral surface; physical optics; projected aperture; reflected fields; Apertures; Erbium; Frequency conversion; Integrated optics; Magnetic fields; Optical frequency conversion; Optical surface waves; Pattern analysis; Physical optics; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
  • Conference_Location
    Newport Beach, CA, USA
  • Print_ISBN
    0-7803-2719-5
  • Type

    conf

  • DOI
    10.1109/APS.1995.530160
  • Filename
    530160