DocumentCode
2088544
Title
A reliability function in the three dimensional parametric space and the study of digital systems
Author
Prasad, Vinod B.
Author_Institution
Dept. of Electr. & Comput. Eng. Technol., Bradley Univ., Peoria, IL, USA
fYear
1994
fDate
10-13 Apr 1994
Firstpage
251
Lastpage
253
Abstract
The reliability of various digital systems are discussed, and an equation for the reliability function is obtained using Markov model with three parameters
Keywords
Markov processes; digital systems; graph theory; reliability; Markov model; digital systems; reliability function; three dimensional parametric space; Digital systems; Environmental economics; Equations; Fault tolerance; Fault tolerant systems; Reliability engineering; Routing; Signal design; Space technology; Tree graphs;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location
Miami, FL
Print_ISBN
0-7803-1797-1
Type
conf
DOI
10.1109/SECON.1994.324309
Filename
324309
Link To Document