• DocumentCode
    2090483
  • Title

    Multiple reflections and improvement of edge scattering in GRECO RCS prediction code

  • Author

    Rius, Juan M. ; Vall-Ilossera, M. ; Jofre, Lluis

  • Author_Institution
    Grup A.M.R., Dpt. Teoria del Senyal i Comunicacions, UPC Apdo. 30002, 08080 Barcelona, Tl. +34-3-4017219, Fax +34-3-4017232
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    386
  • Lastpage
    387
  • Abstract
    GRECO code for monostatic RCS prediction in real time has been extended by considering multiple reflections between surfaces and improving the edge diffraction coefficients. Multiple reflections are analysed through a very efficient ray-tracing algorithm based on the graphical processing technique. Method of equivalent currents for edge scattering has been improved by Mitzner´s and Michaeli´s incremental length diffraction coefficients (ILDC). This communication presents the general features of GRECO code, in particular the advantages of the new graphical processing technique. Emphasis will be placed in the new features of GRECO still unpublished: the ray-tracing algorithm and the implementation of incremental length diffraction coefficients.
  • Keywords
    Diffraction; Geometrical optics; Graphics; Hardware; Optical reflection; Optical surface waves; Physical optics; Ray tracing; Scattering; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336901
  • Filename
    4136630