• DocumentCode
    2090619
  • Title

    Quality analysis of wheat based on BP neural network and Near Infrared Reflectance Spectroscopy

  • Author

    Hexiao, Liu ; Mingliang, Liu ; Laijun, Sun ; Haibo, Qian ; Wenbo, Li ; Lekai, Wang ; Changjun, Dai

  • Author_Institution
    Key Lab. of Electron. Eng., Heilongjiang Univ., Harbin, China
  • fYear
    2011
  • fDate
    27-29 May 2011
  • Firstpage
    775
  • Lastpage
    778
  • Abstract
    With its quick, simple, nicety and nondestructive characteristic, NIRS (Near Infrared Reflectance Spectroscopy) is a new method for quality analysis of wheat. In this paper, a new method to model-building for wheat quality analysis with NIRS is presented. Opposite near infrared parameters shield the testing accuracy from outer disturb and random factors. Local minimization is escaped, and a high convergence velocity is reached by modified BP algorithm. The experimental results indicate that a high-accuracy testing results can be get in spite of large disturb from temperature and moisture.
  • Keywords
    backpropagation; crops; infrared spectra; minimisation; neural nets; quality management; reflectivity; NIRS; convergence velocity; high-accuracy testing; local minimization; modified BP neural network algorithm; near infrared reflectance spectroscopy; opposite near infrared parameters; outer disturbance factor; random factors; wheat quality analysis; Artificial neural networks; Mathematical model; Neurons; Predictive models; Proteins; Spectroscopy; Training; near infrared reflectance spectroscopy; neural network; quality analysis; wheat;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Technology of Agricultural Engineering (ICAE), 2011 International Conference on
  • Conference_Location
    Zibo
  • Print_ISBN
    978-1-4244-9574-0
  • Type

    conf

  • DOI
    10.1109/ICAE.2011.5943907
  • Filename
    5943907