DocumentCode
2093625
Title
Multi-fault diagnosis of DC-nonlinear analog circuits
Author
Luo, Wei-Guo ; Zhang, Su-Wen
Author_Institution
Dept. of Radio Inf. Eng., Wuhan Univ., China
fYear
1988
fDate
7-9 June 1988
Firstpage
1171
Abstract
A method for the fault diagnosis of DC nonlinear analog circuits is proposed. The concepts of independent faulty node compensating current and fault component are introduced, and the sufficient and necessary condition for testability is stated. It is shown that nonlinear networks can be diagnosed effectively if all the nonlinear elements are accessible and there are certain linear accessible nodes.<>
Keywords
analogue circuits; fault location; nonlinear network analysis; DC-nonlinear analog circuits; fault component; fault diagnosis; independent faulty node compensating current; multifault diagnosis; testability; Analog circuits; Artificial intelligence; Circuit faults; Circuit testing; Current measurement; Equations; Fault diagnosis; Matrix decomposition; Niobium; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location
Espoo, Finland
Type
conf
DOI
10.1109/ISCAS.1988.15135
Filename
15135
Link To Document