• DocumentCode
    2095109
  • Title

    Explicit formula for channel mismatch effects in time-interleaved ADC systems

  • Author

    Kurosawa, Naoki ; Maruyama, Kaoru ; Kobayashi, Haruo ; Sugawara, Hidetake ; Kobayashi, Kensuke

  • Author_Institution
    Dept. of Electron. Eng., Gunma Univ., Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    763
  • Abstract
    A time-interleaved ADC system is an effective way to implement a high-sampling-rate ADC with relatively slow circuits. In the system, several channel ADCs operate at interleaved sampling times as if they were effectively a single ADC operating at a much higher sampling rate. However, mismatches such as offset, gain mismatches among channel ADCs as well as timing skew of the clocks distributed to them degrade S/N of the ADC system as a whole. This paper analyzes the channel mismatch effects in the time-interleaved ADC system. Previous analysis showed the effect for each mismatch individually, however in this paper we derive explicit formula for the mismatch effects when all of offset, gain and timing mismatches exist together. We have clarified that the gain and timing mismatch effects interact each other but the offset mismatch effect is independent from them, and this can be seen clearly in frequency domain. We also discuss the bandwidth mismatch effect. The derived formula can be used for calibration algorithms to compensate for the channel mismatch effects
  • Keywords
    analogue-digital conversion; calibration; circuit noise; error correction; frequency-domain analysis; network analysis; random noise; bandwidth mismatch effect.; calibration algorithms; channel mismatch effects; error correction; frequency domain; gain mismatches; high-sampling-rate ADC; interleaved sampling times; offset; time-interleaved ADC; time-interleaved ADC system; timing mismatch effects; timing skew; Bandwidth; Calibration; Circuits; Clocks; Degradation; Error correction; Frequency domain analysis; Instruments; Sampling methods; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848838
  • Filename
    848838