DocumentCode
2095109
Title
Explicit formula for channel mismatch effects in time-interleaved ADC systems
Author
Kurosawa, Naoki ; Maruyama, Kaoru ; Kobayashi, Haruo ; Sugawara, Hidetake ; Kobayashi, Kensuke
Author_Institution
Dept. of Electron. Eng., Gunma Univ., Japan
Volume
2
fYear
2000
fDate
2000
Firstpage
763
Abstract
A time-interleaved ADC system is an effective way to implement a high-sampling-rate ADC with relatively slow circuits. In the system, several channel ADCs operate at interleaved sampling times as if they were effectively a single ADC operating at a much higher sampling rate. However, mismatches such as offset, gain mismatches among channel ADCs as well as timing skew of the clocks distributed to them degrade S/N of the ADC system as a whole. This paper analyzes the channel mismatch effects in the time-interleaved ADC system. Previous analysis showed the effect for each mismatch individually, however in this paper we derive explicit formula for the mismatch effects when all of offset, gain and timing mismatches exist together. We have clarified that the gain and timing mismatch effects interact each other but the offset mismatch effect is independent from them, and this can be seen clearly in frequency domain. We also discuss the bandwidth mismatch effect. The derived formula can be used for calibration algorithms to compensate for the channel mismatch effects
Keywords
analogue-digital conversion; calibration; circuit noise; error correction; frequency-domain analysis; network analysis; random noise; bandwidth mismatch effect.; calibration algorithms; channel mismatch effects; error correction; frequency domain; gain mismatches; high-sampling-rate ADC; interleaved sampling times; offset; time-interleaved ADC; time-interleaved ADC system; timing mismatch effects; timing skew; Bandwidth; Calibration; Circuits; Clocks; Degradation; Error correction; Frequency domain analysis; Instruments; Sampling methods; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location
Baltimore, MD
ISSN
1091-5281
Print_ISBN
0-7803-5890-2
Type
conf
DOI
10.1109/IMTC.2000.848838
Filename
848838
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