• DocumentCode
    2095728
  • Title

    Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers

  • Author

    Krauthauser, Hans Georg ; Winzerling, T. ; Nitsch, Jurgen

  • Author_Institution
    IGET, Otto-von-Guericke-Univ., Magdeburg
  • Volume
    2
  • fYear
    2005
  • fDate
    12-12 Aug. 2005
  • Firstpage
    550
  • Lastpage
    555
  • Abstract
    The autocorrelation function of electrical field strengths for different boundary conditions (tuner positions) at a given special position is proposed in the IEC standard 61000-4-21 as a measure for the determination of the number of uncorrelated boundary conditions in mode-stirred chambers. Additionally, an upper limit for the autocorrelation coefficient is given for a fixed number N of measured tuner positions only. In this paper, we analyze an approach given in the literature that includes the treatment of different N, but still gives results that are inconsistent with the daily measurement practice in mode-stirred chambers. A slight modification of this approach is proposed that leads to consistent results. This paper gives critical values for the autocorrelation coefficients for any number of measured tuner positions based on a statistical analysis of the well known probability distribution of autocorrelation coefficients. The degree of determination and the significance level remain as free parameters that have to be established by the community. The authors propose values for these parameters that are consistent with the example given in the standard
  • Keywords
    reverberation chambers; statistical distributions; autocorrelation coefficients; mode-stirred chambers; probability distribution; statistical analysis; statistical interpretation; Autocorrelation; Boundary conditions; Electric variables measurement; IEC standards; Position measurement; Resonance; Resonant frequency; Statistical analysis; Testing; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-9380-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.2005.1513576
  • Filename
    1513576