DocumentCode
2099533
Title
Improving reliability of magnetic mutual impedance measurement at high excitation level
Author
Mesmin, F. ; Ahmadi, B. ; Chazal, H. ; Kedous-Lebouc, A. ; Sixdenier, F.
Author_Institution
Grenoble Electr. Eng. Lab. (G2Elab), UJF-Grenoble 1, St. Martin d´´Hères, France
fYear
2011
fDate
10-12 May 2011
Firstpage
1
Lastpage
6
Abstract
Power electronic designers are interested in characterization of the magnetic cores permeability up to 10MHz and at high induction level. To achieve this aim, different experimental setups are used to measure mutual impedance spectra. First, impedance measurement methods are carried out on toroidal wound core of 20 μm nanocrystalline ribbons. Measurement uncertainties are estimated and a confidence factor is introduced as a useful consistency test to improve measurement reliability. Then a lumped equivalent circuit is identified to model electrostatic and magnetic frequency behavior of the device under test. It allows calculating complex permeability spectra over the resonance frequency of the device under test. Finally, we point out the limitation due to high excitation level. According to that, a flux-metric experimental setup is described and elliptical hysteresis-loops are measured. These results allow to consider magnetic linear behavior until a few 10mT and to extend complex permeability calculations to high induction level with good reliability.
Keywords
electric impedance measurement; equivalent circuits; magnetic cores; magnetic permeability; nanostructured materials; power electronics; power system measurement; reliability; soft magnetic materials; excitation level; lumped equivalent circuit; magnetic cores permeability; magnetic mutual impedance measurement; measurement reliability; nanocrystalline ribbons; permeability spectra; power electronic designers; resonance frequency; size 20 mum; toroidal wound core; Current measurement; Frequency measurement; Impedance; Impedance measurement; Magnetic cores; Permeability; Voltage measurement; common mode choke; confidence factor; flux-metric measurement; impedance measurement; nanocrystalline;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location
Binjiang
ISSN
1091-5281
Print_ISBN
978-1-4244-7933-7
Type
conf
DOI
10.1109/IMTC.2011.5944231
Filename
5944231
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