• DocumentCode
    2100434
  • Title

    Fast state verification

  • Author

    Sun, Dechang ; Vinnakota, Bapiraju ; Jiang, Wanli

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1998
  • fDate
    19-19 June 1998
  • Firstpage
    619
  • Lastpage
    624
  • Abstract
    Unique input/output (UIO) sequences are used for state verification and functional test in finite state machines. A UIO sequence for a state s distinguishes it from other states in the FSM. Current algorithms to compute UIO sequences are limited in their applicability to FSMs with binary input symbols such as those found in control applications. Execution times of traditional approaches are exponential in the number of FSM inputs. We develop a new heuristic algorithm to generate UIO sequences for FSMs with binary inputs. Execution time is reduced significantly by reducing the size of the search space. When a UIO sequence cannot be generated, our algorithm generates a small number of functional faults for state verification.
  • Keywords
    finite state machines; formal verification; heuristic programming; binary input symbols; binary inputs; fast state verification; finite state machines; functional faults; functional test; heuristic algorithm; unique input/output sequences; Automata; Computer networks; Permission; Protocols; Sun; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1998. Proceedings
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-89791-964-5
  • Type

    conf

  • Filename
    724546