DocumentCode
2100434
Title
Fast state verification
Author
Sun, Dechang ; Vinnakota, Bapiraju ; Jiang, Wanli
Author_Institution
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1998
fDate
19-19 June 1998
Firstpage
619
Lastpage
624
Abstract
Unique input/output (UIO) sequences are used for state verification and functional test in finite state machines. A UIO sequence for a state s distinguishes it from other states in the FSM. Current algorithms to compute UIO sequences are limited in their applicability to FSMs with binary input symbols such as those found in control applications. Execution times of traditional approaches are exponential in the number of FSM inputs. We develop a new heuristic algorithm to generate UIO sequences for FSMs with binary inputs. Execution time is reduced significantly by reducing the size of the search space. When a UIO sequence cannot be generated, our algorithm generates a small number of functional faults for state verification.
Keywords
finite state machines; formal verification; heuristic programming; binary input symbols; binary inputs; fast state verification; finite state machines; functional faults; functional test; heuristic algorithm; unique input/output sequences; Automata; Computer networks; Permission; Protocols; Sun; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1998. Proceedings
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-89791-964-5
Type
conf
Filename
724546
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