DocumentCode
2101296
Title
High-impedance fault detection in EHV transmission lines
Author
Ibrahim, Doaa Khalil ; Eldin, EI Sayed Tag ; Aboul-Zahab, Essam M. ; Saleh, Saber Mohamed
fYear
2008
fDate
12-15 March 2008
Firstpage
192
Lastpage
199
Abstract
The automatic detection of high impedance faults (HIFs) on transmission systems has been one of the most persistent and difficult problems facing utilities as a major safety concern. The paper presents two approaches to HIF detection in extra high voltage transmission lines. Both schemes analyze the nature and dynamics of the arc phenomenon related to HIFs using voltage waveforms at the relaying point. The first scheme is based on discrete wavelet transform (DWT) analysis while the second analyzes the three phase voltages using high frequency tap of the coupling capacitor voltage transformers. To ensure development of reliable algorithms, an accurate modeling of HIF is utilized with its complex characteristics such as buildup, shoulder as well as nonlinearity and asymmetry. Results of computer simulation using ATP/EMTP on 345 kV transmission line system clearly reveal that each of the proposed methods can accurately detect HIFs in the EHV transmission lines as well as their ability to discriminate clearly between HIFs and various switching conditions.
Keywords
discrete wavelet transforms; high-voltage engineering; potential transformers; power system faults; power transmission lines; ATP/EMTP; EHV transmission lines; arc phenomenon; automatic detection; coupling capacitor voltage transformers; digital simulation; discrete wavelet transform; extra high voltage transmission lines; high frequency tap; high-impedance fault detection; pattern recognition; phase voltages; relaying point; transmission systems; voltage 345 kV; voltage waveforms; Couplings; Discrete wavelet transforms; Fault detection; Frequency; Impedance; Relays; Safety; Transmission lines; Voltage; Wavelet analysis; Coupling capacitor voltage transformer (CCVT); Digital simulation; High frequency tap; High impedance fault (HIF); Pattern recognition; Wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Power System Conference, 2008. MEPCON 2008. 12th International Middle-East
Conference_Location
Aswan
Print_ISBN
978-1-4244-1933-3
Electronic_ISBN
978-1-4244-1934-0
Type
conf
DOI
10.1109/MEPCON.2008.4562363
Filename
4562363
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