• DocumentCode
    2102980
  • Title

    Formation of SiC nanostructures on Si surface using C60 by spinning technique

  • Author

    Mondal, Aniruddha ; Jadav, Nilesh ; Das, Utpal

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur
  • fYear
    2008
  • fDate
    22-24 Dec. 2008
  • Firstpage
    28
  • Lastpage
    35
  • Abstract
    SiC nanocrystals growth through the surface reaction between spin-on C60 dissolved in Carbon Disulphide (CS2) and Si substrate and 800degC (100 rains.) annealed has been investigated. Scanning Electron and Atomic Force Microscopy showed the crests of C60 clusters formed preferentially on the Si substrate steps with 40-60 nm cluster sizes. Silicon carbide nanocrystallite formation after anneal. has been confirmed by X-ray diffraction measurements through the most dominant is the 3C-SiC formed, 6H-SiC in some cases has been formed to be equally dominant showed a monotonic fall in the peak intensities with increasing temperature from 16 K to 300 K. The 416 nm peak at 300 K originating from 6H-SiC is the strongest observed. A simple low cost technique has been developed for SiC nanocrystallite growth on Si suitable for light emission.
  • Keywords
    X-ray diffraction; annealing; atomic force microscopy; nanostructured materials; nanotechnology; scanning electron microscopy; semiconductor growth; silicon compounds; surface chemistry; wide band gap semiconductors; Si; SiC; X-ray diffraction; annealing; atomic force microscopy; light emission; nanocrystallite; nanocrystals; nanostructures; scanning electron microscopy; spinning technique; surface reaction; temperature 16 K to 300 K; temperature 800 degC; time 100 min; Annealing; Atomic force microscopy; Atomic measurements; Nanocrystals; Nanostructures; Rain; Scanning electron microscopy; Silicon carbide; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Optoelectronic Materials and Devices, 2008. AOMD 2008. 2nd National Workshop on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-0-230-63718-4
  • Type

    conf

  • Filename
    5075686