• DocumentCode
    2103822
  • Title

    Complex band structure-based non-equilibrium Green´s function (NEGF) transport studies for ultra-scaled carbon nanotube (CNT) transistors [CNTFETs]

  • Author

    Xia, Tongsheng ; Register, Leonard F. ; Banerjee, Sanjay K.

  • Author_Institution
    Microelectron. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    2004
  • fDate
    21-23 June 2004
  • Firstpage
    139
  • Abstract
    Full complex band structure-based NEGF simulation results of the subthreshold leakage characteristics of nano-scale carbon nanotube field-effect transistors (CNTFETs) are provided. These results show qualitatively unconventional subthreshold behavior, which needs to be considered for the scaling of CNTFETs. To fully understand the subthreshold current of nanoscale channel length CNTFETs, tunneling-mediated leakage currents must be considered. And for narrow-gap CNTs, the proximity of the electron tunneling path to the valence band as well as the conduction band should be considered; that is, a simple effective mass approximation is not reliable. In this work, we address the transport behavior of a nanoscale CNTFET with zigzag nanotubes, using the NEGF method with a full-band tight-binding model, including the complex bandstructure effect by the bandgap states of CNTs.
  • Keywords
    Green´s function methods; band structure; carbon nanotubes; energy gap; field effect transistors; leakage currents; nanotube devices; semiconductor device models; tight-binding calculations; tunnelling; CNTFET scaling; NEGF; bandgap states; carbon nanotube field-effect transistors; carrier transport; complex band structure; conduction band; electron tunneling path; full-band tight-binding model; nanoscale CNTFET; narrow-gap CNT; nonequilibrium Green´s function; subthreshold leakage currents; tunneling-mediated leakage currents; ultra-scaled CNT; valence band; zigzag nanotubes; CNTFETs; Carbon nanotubes; Coaxial components; Green´s function methods; Leakage current; Microelectronics; Photonic band gap; Silicon; Subthreshold current; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-8284-6
  • Type

    conf

  • DOI
    10.1109/DRC.2004.1367823
  • Filename
    1367823