Accuracy of effective bits estimation methods

Author

Bertocco, M. ; Narduzzi, C. ; Paglierani, P. ; Petri, D.

Author_Institution

Dipartimento di Elettronica e Inf., Padova Univ., Italy

Volume

2

fYear

1996

fDate

1996

Firstpage

1425

Abstract

The basic assumptions of ADC effective bits estimation procedures are analyzed in depth, and lower bounds to the achievable accuracy are derived. It is shown that such bounds depend on the ratio between the number of acquired samples of the input sinewave and the number of ADC quantization levels. The effect of broad-band noise superimposed on the input sinewave is also analyzed. Results are provided useful for the design of the estimation procedure itself

Keywords

analogue-digital conversion; curve fitting; discrete Fourier transforms; error statistics; estimation theory; quantisation (signal); waveform analysis; ADC; DFT-based algorithms; SNR; achievable accuracy; confidence limits; deterministic quantization; effective bits estimation methods; fitting procedure; input sinewave; lower bounds; number of acquired samples; number of quantization levels; quantization error power; signal model; simulation; sine-fit algorithms; statistical efficiency; stochastic model; superimposed broadband noise effect; Algorithm design and analysis; Analog-digital conversion; Instruments; Performance evaluation; Quantization; Signal generators; Signal to noise ratio; Stochastic resonance; Testing; Yield estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507606

Filename

507606