• DocumentCode
    2104986
  • Title

    Application of Grey Relation Analysis in Image´s Edge Detection of Pests in Stored Grain

  • Author

    Zhou, Long ; Fang, Ming ; Wang, Xue-zhi ; Yi, Mou ; Yu, Zhan-wu

  • Author_Institution
    Wuhan Polytech. Univ., Wuhan
  • fYear
    2008
  • fDate
    21-22 Dec. 2008
  • Firstpage
    405
  • Lastpage
    407
  • Abstract
    There are heavy loss because of pests in stored grain. The detection method of pests in stored grain is always investigated. Researching the harmful stored grain insects on-line examination system, not only has the important academic value, but also has the broad application prospect. The method based on image recognition is often discussed. With development of computer technology, information processing, pattern recognition, intelligence detection, detection method based on image recognition develops fast and becomes main direction of grain pests intelligence detection. This paper puts forward an edge detection algorithm based on grey relation analysis. At first the reference series and compare series are defined. Then the relevant coefficients between the reference series and compare series are calculated to every pixel. Finally, the edge detection is processed and its application in imagepsilas of pests in stored grain is discussed. The examples show that the method can detect the image´s edge of pests in stored grain better.
  • Keywords
    agricultural products; edge detection; grey systems; image recognition; compare series; edge detection; grey relation analysis; image recognition; online examination system; pests; reference series; stored grain; Fourier transforms; Image analysis; Image edge detection; Image recognition; Information analysis; Information processing; Infrared detectors; Insects; Pattern recognition; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application Workshops, 2008. IITAW '08. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3505-0
  • Type

    conf

  • DOI
    10.1109/IITA.Workshops.2008.92
  • Filename
    4731963