• DocumentCode
    2108685
  • Title

    Commercially fabricated radiation hardened 4Mbit SRAM

  • Author

    Hafer, Craig ; Slocum, Duane ; Mabra, J. ; Tyson, Scott

  • Author_Institution
    Aeroflex, Colorado Springs, CO, USA
  • Volume
    4
  • fYear
    2004
  • fDate
    6-13 March 2004
  • Firstpage
    2277
  • Abstract
    Survivability of memory integrated circuits is critical to the successful completion of military, civilian, and commercial space applications. Radiation hardened 4 Mbit SRAMs have been developed for these purposes. Aeroflex Colorado Springs, with support from the Air Force Research Laboratory, has developed, tested, and qualified hardened 4Mbit SRAMs in two configurations 512 K×8 and 128 K×32. Unlike other hardened 4Mbit SRAMs, Aeroflex exploits high-volume commercial manufacturing methods to achieve unprecedented low power and electrical performance. Other inherent benefits to using mature high-volume commercial fabrication processes include high yield and reliability at reduced manufacturing costs.
  • Keywords
    CMOS memory circuits; SRAM chips; integrated circuit design; integrated circuit reliability; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; 4 Mbit; SRAM testing; civilian space applications; commercial space applications; electrical performance; high volume commercial fabrication process; low power performance; memory integrated circuits; military applications; radiation hardened SRAM; reliability; survivability; Application specific integrated circuits; CMOS process; Fabrication; Laboratories; Manufacturing processes; Minimally invasive surgery; Radiation hardening; Random access memory; Single event upset; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2004. Proceedings. 2004 IEEE
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-8155-6
  • Type

    conf

  • DOI
    10.1109/AERO.2004.1368021
  • Filename
    1368021