DocumentCode
2112078
Title
Localization of hemorrhage site in stroke patients using multichannel microwave measurements
Author
Mesri, H.Y.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
5927
Lastpage
5930
Abstract
Microwave measurements from an antenna array placed around the head can be used to detect changes in dielectric properties of the brain. In this paper an algorithm is developed to provide localization information of the site of an intra cerebral hemorrhage. The algorithm is based in the hypothesis that scattering parameters for an antenna pair close to the site of the bleeding will undergo larger changes. The change is measured using a feature derived from the scattering measurements using higher order singular value decomposition and is compared with the feature derived from measurements from a control group of healthy subjects. The proposed algorithm is evaluated on clinical data and the result is compared with computed tomography images of the patients.
Keywords
antenna arrays; biomedical measurement; blood; brain; medical disorders; medical signal processing; microwave measurement; singular value decomposition; antenna array; antenna pair scattering parameters; brain dielectric property changes; computed tomography image comparison; hemorrhage site localization; higher order SVD; intracerebral hemorrhage; localization information; multichannel microwave measurements; scattering measurements; singular value decomposition; stroke patients; Argon; Biomedical imaging; Biomedical measurements; Computed tomography; Microwave FET integrated circuits; Microwave integrated circuits; Microwave measurements; HOSVD; classification; microwave tomography; multichannel microwave measurements; multilinear algebra; signal processing; Algorithms; Hemorrhage; Humans; Microwaves; Stroke;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6347343
Filename
6347343
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