DocumentCode
2115177
Title
The study of Pairwise Condition Covering test technology
Author
Zhu, Shi ; Ding, Qing ; Jiang, Ming
Author_Institution
School of Software Engineering, University of Science and Technology of China, Hefei China
fYear
2010
fDate
4-6 Dec. 2010
Firstpage
7073
Lastpage
7076
Abstract
Multiple Condition Coverage (MCC) is a very strong test criterion in the white-box test, but as it requires much more test cases, it is not useful in practices. We now propose a new method: Pairwise Condition Covering test, which simplified MCC, but inherited the advantage of MCC, meanwhile it needs only a few numbers of test cases. Compare to the widely used Modified Condition/Decision Coverage (MC/DC), it will use less test cases when there are quite a lot of conditions; besides it can discover the deficiencies which MC / DC could not identify.
Keywords
Arrays; Computers; Educational institutions; Programming; Software; Software engineering; Testing; Modified Condition/Decision Coverage; Multiple Condition Coverage; Pairwise Condition Coverage;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location
Hangzhou, China
Print_ISBN
978-1-4244-7616-9
Type
conf
DOI
10.1109/ICISE.2010.5689928
Filename
5689928
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