• DocumentCode
    2115177
  • Title

    The study of Pairwise Condition Covering test technology

  • Author

    Zhu, Shi ; Ding, Qing ; Jiang, Ming

  • Author_Institution
    School of Software Engineering, University of Science and Technology of China, Hefei China
  • fYear
    2010
  • fDate
    4-6 Dec. 2010
  • Firstpage
    7073
  • Lastpage
    7076
  • Abstract
    Multiple Condition Coverage (MCC) is a very strong test criterion in the white-box test, but as it requires much more test cases, it is not useful in practices. We now propose a new method: Pairwise Condition Covering test, which simplified MCC, but inherited the advantage of MCC, meanwhile it needs only a few numbers of test cases. Compare to the widely used Modified Condition/Decision Coverage (MC/DC), it will use less test cases when there are quite a lot of conditions; besides it can discover the deficiencies which MC / DC could not identify.
  • Keywords
    Arrays; Computers; Educational institutions; Programming; Software; Software engineering; Testing; Modified Condition/Decision Coverage; Multiple Condition Coverage; Pairwise Condition Coverage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science and Engineering (ICISE), 2010 2nd International Conference on
  • Conference_Location
    Hangzhou, China
  • Print_ISBN
    978-1-4244-7616-9
  • Type

    conf

  • DOI
    10.1109/ICISE.2010.5689928
  • Filename
    5689928