DocumentCode
2116675
Title
Effect of saccular aneurysm and parent artery morphology on hemodynamics of cerebral bifurcation aneurysms
Author
Farnoush, A. ; Qian, Yi ; Takao, Hidekuni ; Murayama, Yuko ; Avolio, A.
Author_Institution
Australian Sch. of Adv. Med., Macquarie Univ., Sydney, NSW, Australia
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
6677
Lastpage
6680
Abstract
Morphological descriptors of aneurysms have been used to assess aneurysm rupture. This study investigated the relation between the morphological parameters and the flow related parameter of energy loss (EL). Four size indices and one shape index were assessed in idealized middle cerebral artery models with various aneurysm morphologies. Four patient-specific aneurysms (2 ruptured, 2 unruptured) were virtually manipulated by removing the aneurysms from their parent arteries and merging them with the idealized bifurcation models. EL was calculated from the energy difference between inflow and outflow. The results indicate that among size indices, EL is mostly dependent on bottleneck factor and less dependent on the aspect ratio. Results also showed that there is a direct relationship between nonsphericity index (NSI) and EL in manipulated models. No specific correlation was found between EL and NSI in patient-specific models.
Keywords
bifurcation; blood vessels; brain; haemodynamics; aspect ratio; bottleneck factor; cerebral bifurcation aneurysm; energy loss; flow related parameter; hemodynamics; idealized bifurcation model; middle cerebral artery model; nonsphericity index; parent artery morphology; saccular aneurysm; shape index; size index; Aneurysm; Arteries; Bifurcation; Hemodynamics; Morphology; Neck; Shape; Algorithms; Aneurysm; Aneurysm, Ruptured; Cerebral Angiography; Computer Simulation; Hemodynamics; Humans; Intracranial Aneurysm; Middle Cerebral Artery; Models, Anatomic; Models, Statistical; Risk;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6347526
Filename
6347526
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