• DocumentCode
    2117705
  • Title

    Design and analysis of a robust all-digital clock generation system with a DLL-based TDC

  • Author

    Han, Yizhi ; Rhee, Woogeun ; Wang, Zhihua

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2012
  • fDate
    21-23 April 2012
  • Firstpage
    3152
  • Lastpage
    3156
  • Abstract
    A PVT-insensitive all-digital clock generation system architecture has been presented. As a key block in ADPLL, the TDC is based on DLL and can exactly cover one period of ADPLL output. Compared to conventional open-loop TDC, the proposed one significantly reduces INL of delay line to decrease fractional spur of ADPLL. Besides that, thermometer output of proposed one makes phase information simpler to process while conventional one needs more calculation. Designed in 65nm, detailed schematic of TDC is shown. Layout of ADPLL takes an area of 0.71mm2. TDC occupies 0.05 mm2 while has a power consumption of 2.1 mW.
  • Keywords
    delay lines; digital phase locked loops; frequency synthesizers; thermometers; time-digital conversion; ADPLL; DLL; PVT; TDC; all-digital clock generation system; delay line; phase information; power 2.1 mW; size 65 nm; thermometer; Delay; Delay lines; Frequency modulation; Layout; Phase locked loops; Phase noise; Quantization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on
  • Conference_Location
    Yichang
  • Print_ISBN
    978-1-4577-1414-6
  • Type

    conf

  • DOI
    10.1109/CECNet.2012.6201657
  • Filename
    6201657