DocumentCode
2117705
Title
Design and analysis of a robust all-digital clock generation system with a DLL-based TDC
Author
Han, Yizhi ; Rhee, Woogeun ; Wang, Zhihua
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear
2012
fDate
21-23 April 2012
Firstpage
3152
Lastpage
3156
Abstract
A PVT-insensitive all-digital clock generation system architecture has been presented. As a key block in ADPLL, the TDC is based on DLL and can exactly cover one period of ADPLL output. Compared to conventional open-loop TDC, the proposed one significantly reduces INL of delay line to decrease fractional spur of ADPLL. Besides that, thermometer output of proposed one makes phase information simpler to process while conventional one needs more calculation. Designed in 65nm, detailed schematic of TDC is shown. Layout of ADPLL takes an area of 0.71mm2. TDC occupies 0.05 mm2 while has a power consumption of 2.1 mW.
Keywords
delay lines; digital phase locked loops; frequency synthesizers; thermometers; time-digital conversion; ADPLL; DLL; PVT; TDC; all-digital clock generation system; delay line; phase information; power 2.1 mW; size 65 nm; thermometer; Delay; Delay lines; Frequency modulation; Layout; Phase locked loops; Phase noise; Quantization;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on
Conference_Location
Yichang
Print_ISBN
978-1-4577-1414-6
Type
conf
DOI
10.1109/CECNet.2012.6201657
Filename
6201657
Link To Document