• DocumentCode
    2120025
  • Title

    PV inverter performance and reliability: What is the role of the bus capacitor?

  • Author

    Flicker, Jack ; Kaplar, Robert ; Marinella, Matthew ; Granata, Jennifer

  • Author_Institution
    Sandia National Laboratories, Albuquerque, NM 87185, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In order to elucidate how the degradation of individual components affects the state of the photovoltaic inverter as a whole, we have carried out SPICE simulations to investigate the voltage and current ripple on the DC bus. The bus capacitor is generally considered to be among the least reliable components of the system, so we have simulated how the degradation of bus capacitors affects the AC ripple at the terminals of the PV module. Degradation-induced ripple leads to an increased degradation rate in a positive feedback cycle. Additionally, laboratory experiments are being carried out to ascertain the reliability of metallized thin film capacitors. By understanding the degradation mechanisms and their effects on the inverter as a system, steps can be made to more effectively replace marginal components with more reliable ones, increasing the lifetime and efficiency of the inverter and decreasing its cost per watt towards the US Department of Energy goals.
  • Keywords
    Capacitors; Degradation; Inverters; Photovoltaic systems; Power system reliability; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
  • Conference_Location
    Austin, TX, USA
  • Type

    conf

  • DOI
    10.1109/PVSC-Vol2.2012.6656709
  • Filename
    6656709