DocumentCode
2120025
Title
PV inverter performance and reliability: What is the role of the bus capacitor?
Author
Flicker, Jack ; Kaplar, Robert ; Marinella, Matthew ; Granata, Jennifer
Author_Institution
Sandia National Laboratories, Albuquerque, NM 87185, USA
fYear
2012
fDate
3-8 June 2012
Firstpage
1
Lastpage
3
Abstract
In order to elucidate how the degradation of individual components affects the state of the photovoltaic inverter as a whole, we have carried out SPICE simulations to investigate the voltage and current ripple on the DC bus. The bus capacitor is generally considered to be among the least reliable components of the system, so we have simulated how the degradation of bus capacitors affects the AC ripple at the terminals of the PV module. Degradation-induced ripple leads to an increased degradation rate in a positive feedback cycle. Additionally, laboratory experiments are being carried out to ascertain the reliability of metallized thin film capacitors. By understanding the degradation mechanisms and their effects on the inverter as a system, steps can be made to more effectively replace marginal components with more reliable ones, increasing the lifetime and efficiency of the inverter and decreasing its cost per watt towards the US Department of Energy goals.
Keywords
Capacitors; Degradation; Inverters; Photovoltaic systems; Power system reliability; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
Conference_Location
Austin, TX, USA
Type
conf
DOI
10.1109/PVSC-Vol2.2012.6656709
Filename
6656709
Link To Document