DocumentCode
2120495
Title
Pulsed-bias/Pulsed-RF Device Measurement System Requirements
Author
Scott, Jonathan ; Sayed, Mohamed ; Schmitz, Paul ; Parker, Anthony
Author_Institution
Department of Electrical Engineering, University of Sydney, 2006, Australia. Facsimile:+61(2)692-3847, Phone: +61(2)692-3294, e-mail: jbs@ee.su.oz.au
Volume
1
fYear
1994
fDate
5-9 Sept. 1994
Firstpage
951
Lastpage
961
Abstract
We describe a pulsed-bias, pulsed-RF device measurement system with high bias power (6A/40V), high RF power capability (50W at 2GHz and lOW at 50GHz), and high resolution (16-bit). This system is intended to support both RF characterisation outside device continuous safe operating area (SOA), and data-acquisition for device modelling. The system is modular and flexible, offers very small duty cycles (<0.001%) simultaneous wide dynamic range (75dB at 50GHz), and employs instruments which are already available. We present novel measurements on several GaAs devices and draw conclusions important for future device characterisation efforts.
Keywords
Australia; Instruments; Power measurement; Power system modeling; Pulse generation; Pulse measurements; Pulsed power supplies; Radio frequency; Semiconductor optical amplifiers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1994. 24th European
Conference_Location
Cannes, France
Type
conf
DOI
10.1109/EUMA.1994.337335
Filename
4138380
Link To Document