• DocumentCode
    2123598
  • Title

    AlGaN/GaN power HEMT devices for future energy conversion applications

  • Author

    Liang, Yung C. ; Samudra, Ganesh S. ; Huolin Huang ; Chih-Fang Huang ; Ting-Fu Chang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2013
  • fDate
    25-26 Feb. 2013
  • Firstpage
    7
  • Lastpage
    10
  • Abstract
    The AlGaN/GaN high electron mobility transistor (HEMT) has drawn great interest in high power and high frequency applications owing to its outstanding material advantages, such as large critical electric field, high electron saturation velocity and the ability to form the high-density two dimensional electron gas (2DEG) conduction channel at the hetero interface. In this paper, a topical review on the device features is made, namely on its polarisation effects that lead to 2DEG formation at the AlGaN/GaN heterojunction, the surface field plate influence and the trap charges induced current collapse phenomenon during pulse operations. These effects are very important in understanding the AlGaN/GaN power HEMT devices.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; power HEMT; two-dimensional electron gas; wide band gap semiconductors; 2D electron gas conduction channel; 2DEG conduction channel; AlGaN-GaN; electric field; energy conversion; hetero interface; high electron mobility transistor; high electron saturation velocity; polarisation effects; power HEMT device; pulse operation; surface field plate influence; trap charge; Aluminum gallium nitride; Electron traps; Gallium nitride; HEMTs; Logic gates; MODFETs; Piezoelectric polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4673-3036-7
  • Type

    conf

  • DOI
    10.1109/ISNE.2013.6512270
  • Filename
    6512270