• DocumentCode
    2123679
  • Title

    Electron coupling in InGaAs/GaAs quantum dot-pairs fabricated with InP island stressors

  • Author

    Ren, Hong-Wen ; Masumoto, Yasuaki

  • Author_Institution
    ERATO, Japan Sci. & Technol. Corp., Tsukuba, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    Coupled quantum dot (QD)-pairs were fabricated by stressing the near-surface InGaAs/GaAs coupled quantum wells (QWs) with self-assembled InP islands. The coupling strength in the dot-pair was studied by varying the barrier layer width separating the two dots and the indium composition in the lower dot. Strong coupling was observed at a barrier less than 4 nm. Anti-bonding of the two ground states as well as all the bonding states were observed by state filling in the photoluminescence spectra. By tuning the indium composition in the lower QW to adjust the lower QD state energies before coupling relative to those in the upper QD, crossing of the bonding and anti-bonding states is achieved
  • Keywords
    III-V semiconductors; gallium arsenide; ground states; indium compounds; interface states; photoluminescence; semiconductor quantum dots; semiconductor quantum wells; 4 nm; InGaAs-GaAs-InP; InGaAs/GaAs quantum dot-pairs; InP island stressors; anti-bonding states; bonding states; coupling strength; dot-pair; electron coupling; ground states; near-surface InGaAs/GaAs coupled quantum wells; photoluminescence spectra; self-assembled InP islands; Bonding; Capacitive sensors; Electrons; Gallium arsenide; Indium gallium arsenide; Indium phosphide; Laser tuning; Photoluminescence; Quantum dots; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
  • Conference_Location
    Williamsburg, VA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6320-5
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2000.850269
  • Filename
    850269