DocumentCode
2123679
Title
Electron coupling in InGaAs/GaAs quantum dot-pairs fabricated with InP island stressors
Author
Ren, Hong-Wen ; Masumoto, Yasuaki
Author_Institution
ERATO, Japan Sci. & Technol. Corp., Tsukuba, Japan
fYear
2000
fDate
2000
Firstpage
211
Lastpage
214
Abstract
Coupled quantum dot (QD)-pairs were fabricated by stressing the near-surface InGaAs/GaAs coupled quantum wells (QWs) with self-assembled InP islands. The coupling strength in the dot-pair was studied by varying the barrier layer width separating the two dots and the indium composition in the lower dot. Strong coupling was observed at a barrier less than 4 nm. Anti-bonding of the two ground states as well as all the bonding states were observed by state filling in the photoluminescence spectra. By tuning the indium composition in the lower QW to adjust the lower QD state energies before coupling relative to those in the upper QD, crossing of the bonding and anti-bonding states is achieved
Keywords
III-V semiconductors; gallium arsenide; ground states; indium compounds; interface states; photoluminescence; semiconductor quantum dots; semiconductor quantum wells; 4 nm; InGaAs-GaAs-InP; InGaAs/GaAs quantum dot-pairs; InP island stressors; anti-bonding states; bonding states; coupling strength; dot-pair; electron coupling; ground states; near-surface InGaAs/GaAs coupled quantum wells; photoluminescence spectra; self-assembled InP islands; Bonding; Capacitive sensors; Electrons; Gallium arsenide; Indium gallium arsenide; Indium phosphide; Laser tuning; Photoluminescence; Quantum dots; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
Conference_Location
Williamsburg, VA
ISSN
1092-8669
Print_ISBN
0-7803-6320-5
Type
conf
DOI
10.1109/ICIPRM.2000.850269
Filename
850269
Link To Document