• DocumentCode
    2124664
  • Title

    Multi 6 inch technology for GaAs, GaInP and AlGaInP compounds

  • Author

    Schmitt, T. ; Deufel, M. ; Strauch, G. ; Schineller, B. ; Heuken, M. ; Juergensen, H.

  • Author_Institution
    AIXTRON AG, Aachen, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    357
  • Lastpage
    360
  • Abstract
    The increasing demand for high performance, low cost GaAs and InP based devices pushes the MOVPE growth technology towards larger wafer sizes. To meet the industrial requirements we developed the Planetary Reactor concept with the capability to grow on five 6 inch wafers simultaneously. We optimized the growth process for GaAs, GaInP and AlGaInP layers. GaAs/AlAs distributed Bragg reflectors (DBR) were grown as sensitive demonstrators of material quality and homogeneity. The photoluminescence (PL) wavelength and intensity homogeneities as well as thickness mappings and the electrical properties were investigated. Under optimized conditions thickness uniformities of ±0.5% were achieved. GaInP showed wavelength homogeneities of 0.9% with a mean peak wavelength of 652.3 nm measured on a 6" wafer. Six inch AlGaAs/GaInP/AlGaAs test structures exhibited wavelength homogeneities as good as 0.2% with a mean peak wavelength of 689.7 nm. In addition, the maximum precursor efficiency of 54% proves the system adapted for production needs since a considerable reduction of the cost per run can be achieved
  • Keywords
    III-V semiconductors; MOCVD coatings; aluminium compounds; gallium arsenide; gallium compounds; indium compounds; photoluminescence; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; 6 in; 652.3 nm; 689.7 nm; AlGaInP; GaAs; GaInP; MOVPE growth technology; Planetary Reactor concept; distributed Bragg reflectors; electrical properties; high performance; homogeneity; industrial requirements; larger wafer sizes; low cost; material quality; maximum precursor efficiency; multi 6 inch technology; photoluminescence; thickness mappings; Costs; Distributed Bragg reflectors; Epitaxial growth; Epitaxial layers; Extraterrestrial measurements; Gain measurement; Gallium arsenide; Indium phosphide; Inductors; Photoluminescence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
  • Conference_Location
    Williamsburg, VA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6320-5
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2000.850306
  • Filename
    850306