• DocumentCode
    2125020
  • Title

    Extent the retention time in DRAM using 3C decoder

  • Author

    Minghaw Jing ; Chong-Dao Lee ; Chang, Yuan-Chih

  • Author_Institution
    Dept. of Inf. Eng., I-Shou Univ., Kaohsiung, Taiwan
  • fYear
    2013
  • fDate
    25-26 Feb. 2013
  • Firstpage
    195
  • Lastpage
    198
  • Abstract
    The increasing mobile memory applications, such as NB, PDA, mobile phones, digital cameras, MP3 music players, and so on, bring the demands for diverse memory solutions in the post-PC era. The DRAM cells must be periodically refreshed to prevent loss of data; these refresh operations waste energy and degrade system performance. Existing DRAM devices refresh all cells at a rate determined by the leakiest cell in the device, however, most DRAM cells can retain data for significantly longer. [1] proposes a method refreshing most DRAM cells at a low rate, while selectively refreshing weak cells at a higher rate, can result in a significant decrease in refresh overhead. On the other hand, having SECDED support to cope with the soft errors in DRAM memories seems too weak. In this paper a 3C decoder with the capability of DEC/QED is proposed. This design requires no modification to DRAM. Applying on DRAM and eDRAM, this refresh controller achieves at least 75% refresh reduction, at a modest storage overhead of redundant 8KB DRAM memory. Its benefits are designing a robust DRAM system to the various applications.
  • Keywords
    DRAM chips; integrated circuit design; 3C decoder; DEC/QED; DRAM cells; DRAM devices; MP3 music players; NB; PDA; SECDED support; digital cameras; eDRAM; leakiest cell; memory solutions; mobile memory applications; mobile phones; post-PC era; redundant DRAM memory; refresh controller; refresh reduction; retention time; robust DRAM system; soft errors; storage overhead; system performance; waste energy; Arrays; Decoding; Error correction codes; Next generation networking; Random access memory; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4673-3036-7
  • Type

    conf

  • DOI
    10.1109/ISNE.2013.6512326
  • Filename
    6512326