• DocumentCode
    2127808
  • Title

    Structural effects in electrical conductivity of SnO2 thin films

  • Author

    Ivashchenko, Anatolii ; Kerner, Lacov

  • Author_Institution
    Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldova
  • Volume
    2
  • fYear
    1997
  • fDate
    7-11 Oct 1997
  • Firstpage
    451
  • Abstract
    Electrical conductivity in SnO2 thin films is studied within the framework of percolation theory. To improve the agreement between experiment and theory the effect of film microstructure was taken into account by chose the uniform function for energy distribution of intergrain barrier heights
  • Keywords
    crystal microstructure; electrical conductivity; percolation; semiconductor thin films; tin compounds; SnO2; SnO2 thin films; electrical conductivity; energy distribution; film microstructure; intergrain barrier heights; percolation theory; structural effects; Conductivity; Crystallization; Resistors; Temperature; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-3804-9
  • Type

    conf

  • DOI
    10.1109/SMICND.1997.651244
  • Filename
    651244
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2127808