• DocumentCode
    2130864
  • Title

    Co-training by Committee: A New Semi-supervised Learning Framework

  • Author

    Hady, M. ; Schwenker, Friedhelm

  • Author_Institution
    Inst. of Neural Inf. Process., Univ. of Ulm, Ulm
  • fYear
    2008
  • fDate
    15-19 Dec. 2008
  • Firstpage
    563
  • Lastpage
    572
  • Abstract
    For many data mining applications, it is necessary to develop algorithms that use unlabeled data to improve the accuracy of the supervised learning. Co-Training is a popular semi-supervised learning algorithm. It assumes that each example is represented by two or more redundantly sufficient sets of features (views) and these views are independent given the class. However, these assumptions are not satisfied in many real-world application domains. Therefore, we present a framework called co-training by committee (CoBC), in which a set of diverse classifiers are used to learn each other. The framework is a simple, general single-view semi-supervised learner that can use any ensemble learner to build diverse committees. Experimental studies on CoBC using bagging, AdaBoost and the random subspace method (RSM) as ensemble learners demonstrate that error diversity among classifiers leads to an effective co-training that requires neither redundant and independent views nor different learning algorithms.
  • Keywords
    data mining; learning (artificial intelligence); random processes; AdaBoost; cotraining by committee; data mining applications; diverse classifiers; error diversity; random subspace method; real-world application domains; semisupervised learning framework; Bagging; Conferences; Content based retrieval; Data mining; Image retrieval; Information processing; Information retrieval; Object detection; Semisupervised learning; Supervised learning; classification; co-training; data mining; ensemble learning; learning from unlabeled data; semi-supervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshops, 2008. ICDMW '08. IEEE International Conference on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-0-7695-3503-6
  • Electronic_ISBN
    978-0-7695-3503-6
  • Type

    conf

  • DOI
    10.1109/ICDMW.2008.27
  • Filename
    4733980