• DocumentCode
    2132543
  • Title

    Radiation damage effects on X- and gamma-ray N+NPP+ silicon detectors

  • Author

    Cimpoca, Valerica ; Petris, Mariana ; Ruscu, Radu ; Moraru, Rodica ; Breten, Madalina ; Cimpoca, Maria

  • Author_Institution
    Nat. Inst. for Mater. Phys., Bucharest, Romania
  • Volume
    2
  • fYear
    1997
  • fDate
    7-11 Oct 1997
  • Firstpage
    515
  • Abstract
    The paper describes some results concerning technology and behaviour of Xand gamma-ray N+PP+ silicon detectors used in physics research, industrial and medical radiography, and non-destructive testing. Devices manufactured under this technology proved to be stable after an exposure in high intensity gamma field with the dose range of 10 krad-5 Mrad. Nuclear radiation resistance was studied by irradiation with 60Co gamma source (1.17, 1.33 MeV) at dose rates of 59 krad/hour and 570 krad/hour
  • Keywords
    X-ray detection; elemental semiconductors; gamma-ray detection; silicon radiation detectors; N+NPP+ Si detectors; Si; X-ray detectors; gamma-ray detectors; Gamma ray detection; Gamma ray detectors; Immune system; Manufacturing industries; Medical tests; Nondestructive testing; Paper technology; Physics; Radiography; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-3804-9
  • Type

    conf

  • DOI
    10.1109/SMICND.1997.651297
  • Filename
    651297
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2132543