• DocumentCode
    2136811
  • Title

    Creep life assessment of tin based lead free solders based on the imaginary initial strain rate

  • Author

    Monden, Kenji

  • Author_Institution
    DENKA, Tokyo
  • fYear
    2006
  • fDate
    May 30 2006-June 2 2006
  • Firstpage
    990
  • Lastpage
    996
  • Abstract
    The creep properties of tin based lead free solders which are Sn3.0Ag0.5Cu and Sn7.5Zn3.0Bi were investigated at temperatures between 298K and 398K. The creep rupture time decreases with increasing the initial stress and the temperature. The analysis of creep curves of the tin based lead free solders apply the Omega method. The creep rate epsivdot is expressed by following formula : ln epsivdot = ln epsivdot0 + Omegaepsiv, where epsivdot0 and Omega, are experimentally determined. The parameter epsivdot0 which is the imaginary initial strain rate increases with increasing the initial stress and the temperature. The parameter Omega is temperature dependent but less dependent of initial stress. The activation energy for epsivdot0 is 108 kJ/mol at Sn3.0Ag0.5Cu and 83 kJ/mol at Sn7.5Zn3.0Bi. The energies suggest that the lattice diffusion of tin is dominant at creep deformation. The creep rupture time is calculated using the parameters, epsivdot0 and Omega. The calculated creep rupture time is good agreement with the measured time
  • Keywords
    bismuth alloys; copper alloys; creep fracture; silver alloys; solders; strain measurement; tin alloys; zinc alloys; 298 K; 398 K; SnAgCu; SnZnBi; activation energy; creep curve; creep deformation; creep life assessment; creep rupture time; imaginary initial strain rate; lattice diffusion; tin based lead free solders; Area measurement; Capacitive sensors; Creep; Environmentally friendly manufacturing techniques; Heat treatment; Lead; System testing; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronics Systems, 2006. ITHERM '06. The Tenth Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    0-7803-9524-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2006.1645453
  • Filename
    1645453