• DocumentCode
    2137763
  • Title

    Fast multipole integral equation method for VLSI interconnect inductance calculation

  • Author

    Wang, Xiaoli ; Luo, Xianjue

  • Author_Institution
    Dept. of Electr. Eng., Xian Jiaotong Univ., Xian
  • fYear
    2008
  • fDate
    4-7 May 2008
  • Abstract
    In this paper, a modified fast multipole integral (FMI) method is proposed for the calculation of the frequency dependent inductance of on-chip interconnects. The method is based on the discretization of the integral formulations and the fast multipole method by which the magnetic vector potentials induced by the currents through the conductors were calculated at the cost of O (N), where N is the number of the conductor elements divided in the hierarchical manner. The numeral results of integrated circuit interconnect structures demonstrate that the new approach significantly improves the calculation speed and reduce the memory consumed as the number of on chip interconnects under analysis continuously goes up when the former filament-based inductance extraction algorithm, such as Fasthenry, is out of practice. And the self/mutual inductance extracted by the proposed method can also keep a good precision as shown in the numerical results.
  • Keywords
    VLSI; conductors (electric); integral equations; integrated circuit interconnections; VLSI interconnect inductance calculation; fast multipole integral equation; filament-based inductance extraction algorithm; frequency dependent inductance; integrated circuit interconnect structures; magnetic vector potentials; onchip interconnects; Algorithm design and analysis; Conductors; Costs; Crosstalk; Frequency dependence; Inductance; Integral equations; Integrated circuit interconnections; Magnetic flux; Very large scale integration; VLSI; fast multiple method; inductance extraction; interconnect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4244-1642-4
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2008.4564871
  • Filename
    4564871