DocumentCode
2138775
Title
Experimental and theoretical study of parasitic leakage/resonance in a K/Ka-Band MMIC package(003) 5336168
Author
Yook, J.G. ; Katehi, L.P.B. ; Simons, Rainee N. ; Shalkhauser, K.
Author_Institution
Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
Volume
1
fYear
1996
fDate
17-21 June 1996
Firstpage
223
Abstract
In this paper, electromagnetic leakage and spurious resonances in a K/Ka-band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with measured data. Both in measured and calculated data several spurious resonances are observed in the 18 to 24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM.
Keywords
MMIC phase shifters; finite element analysis; integrated circuit packaging; 18 to 40 GHz; K-band; Ka-band; MMIC hermetic package; finite element method; numerical simulation; parasitic electromagnetic leakage; phase shifter chip; spurious resonances; Computational modeling; Electromagnetic measurements; Electromagnetic radiation; Frequency; MMICs; NASA; Packaging; Phase shifters; Resonance; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.508498
Filename
508498
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