DocumentCode
2142126
Title
High performance CMOS surrounding gate transistor (SGT) for ultra high density LSIs
Author
Takato, H. ; Sunouchi, K. ; Okabe, N. ; Nitayama, A. ; Hieda, K. ; Horiguchi, F. ; Masuoka, F.
Author_Institution
Toshiba Corp., Kawasaki, Japan
fYear
1988
fDate
11-14 Dec. 1988
Firstpage
222
Lastpage
225
Abstract
A novel transistor with compact structure has been developed for MOS devices. This transistor, whose gate electrode surrounds the pillar silicon island, reduces the occupied area for all kinds of circuits. For example, the occupied area of a CMOS inverter can be shrunk to 50% of that using planar transistors. The other advantages are steep cutoff characteristics, very small substrate bias effects, and high reliability. These features are due to the unique structure, which results in greater gate controllability and in electric field relaxation at the drain edge.<>
Keywords
CMOS integrated circuits; VLSI; integrated circuit technology; reliability; semiconductor technology; CMOS inverter; CMOS surrounding gate transistor; Si pillar channel; ULSI; compact structure; drain edge; electric field relaxation; features; greater gate controllability; high reliability; nonplanar structure; small substrate bias effects; steep cutoff characteristics; ultra high density LSIs; vertical channel CMOS; Circuits; Degradation; Electrodes; Impurities; Inverters; Large scale integration; Silicon; Threshold voltage; Transistors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1988.32796
Filename
32796
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