• DocumentCode
    2142126
  • Title

    High performance CMOS surrounding gate transistor (SGT) for ultra high density LSIs

  • Author

    Takato, H. ; Sunouchi, K. ; Okabe, N. ; Nitayama, A. ; Hieda, K. ; Horiguchi, F. ; Masuoka, F.

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    222
  • Lastpage
    225
  • Abstract
    A novel transistor with compact structure has been developed for MOS devices. This transistor, whose gate electrode surrounds the pillar silicon island, reduces the occupied area for all kinds of circuits. For example, the occupied area of a CMOS inverter can be shrunk to 50% of that using planar transistors. The other advantages are steep cutoff characteristics, very small substrate bias effects, and high reliability. These features are due to the unique structure, which results in greater gate controllability and in electric field relaxation at the drain edge.<>
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit technology; reliability; semiconductor technology; CMOS inverter; CMOS surrounding gate transistor; Si pillar channel; ULSI; compact structure; drain edge; electric field relaxation; features; greater gate controllability; high reliability; nonplanar structure; small substrate bias effects; steep cutoff characteristics; ultra high density LSIs; vertical channel CMOS; Circuits; Degradation; Electrodes; Impurities; Inverters; Large scale integration; Silicon; Threshold voltage; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32796
  • Filename
    32796