DocumentCode
2143319
Title
MTTF-balanced pipeline design
Author
Oboril, Fabian ; Tahoori, Mehdi B.
Author_Institution
Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT), Germany
fYear
2013
fDate
18-22 March 2013
Firstpage
270
Lastpage
275
Abstract
As CMOS technologies enter nanometer scales, microprocessors become more vulnerable to transistor aging mainly due to Bias Temperature Instability and Hot Carrier Injection. These phenomena lead to increasing device delays during the operational lifetime, which results in increasing pipeline stage delays. However, the aging rates of different stages are different. Hence, a previously delay-balanced pipeline becomes increasingly imbalanced resulting in a non-optimized design in terms of Mean Time to Failure (MTTF), frequency, area and power consumption. In this paper, we propose an MTTF-balanced pipeline design, in which the pipeline stage delays are balanced after the desired lifetime rather than at design time. This can lead to significant MTTF (lifetime) improvements as well as additional performance, area, and power benefits. Our experimental results show that MTTF of the FabScalar microprocessor can be improved by 2x (or frequency by 3 %) while achieving an additional 4% power, and 1% area optimization.
Keywords
Aging; Clocks; Delays; Logic gates; Microprocessors; Pipelines; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.068
Filename
6513514
Link To Document