• DocumentCode
    2143319
  • Title

    MTTF-balanced pipeline design

  • Author

    Oboril, Fabian ; Tahoori, Mehdi B.

  • Author_Institution
    Dependable Nano Computing (CDNC), Karlsruhe Institute of Technology (KIT), Germany
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    270
  • Lastpage
    275
  • Abstract
    As CMOS technologies enter nanometer scales, microprocessors become more vulnerable to transistor aging mainly due to Bias Temperature Instability and Hot Carrier Injection. These phenomena lead to increasing device delays during the operational lifetime, which results in increasing pipeline stage delays. However, the aging rates of different stages are different. Hence, a previously delay-balanced pipeline becomes increasingly imbalanced resulting in a non-optimized design in terms of Mean Time to Failure (MTTF), frequency, area and power consumption. In this paper, we propose an MTTF-balanced pipeline design, in which the pipeline stage delays are balanced after the desired lifetime rather than at design time. This can lead to significant MTTF (lifetime) improvements as well as additional performance, area, and power benefits. Our experimental results show that MTTF of the FabScalar microprocessor can be improved by 2x (or frequency by 3 %) while achieving an additional 4% power, and 1% area optimization.
  • Keywords
    Aging; Clocks; Delays; Logic gates; Microprocessors; Pipelines; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.068
  • Filename
    6513514