DocumentCode
2145019
Title
ZnO nanorods on plastic substrate from zinc nitrate hexahydrate and hexamethylenetetramine solution
Author
Adriyanto, Feri ; Sze, Po-Wen ; Wang, Yeong-Her
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
592
Lastpage
595
Abstract
The control dimension and morphology in zinc oxide (ZnO) nanorods are critical issues in the fabrication of electronic and optical nanodevices. This study discusses ZnO nanorods on an ITO-laminated plastic substrate of polyethylene terephthalate. The substrate was immersed in a zinc nitrate hexahydrate Zn(NO3)2.6H2O and hexamethylenetetramine C12H6N4. solution under various deposition conditions. The X-ray diffraction pattern showed that the films were composed of ZnO and Zn(OH)2, and that the ZnO crystal had strong x-ray reflection peaks (100 and 101), in which the c-axis was parallel to the substrate. To measure the elemental composition, the empirical formula, and the chemical state, X-ray photoelectron spectroscopy were used to examine the ZnO surface; peaks belonging to Zn and O were clearly detected. A larger surface roughness was achieved after adding a 0.20 M concentration of hexamethylenetetramine. The ZnO nanorods¿ microphotograph was found at a deposition temperature of 95° C and a 2 ml volume of 0.1 M NaOH. It was also found that the crystal shows a tip-nanorod morphology with a typical diameter of 0.3 ¿m and a 3.0 ¿m rod length.
Keywords
II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; indium compounds; nanostructured materials; semiconductor quantum wires; semiconductor thin films; surface roughness; wide band gap semiconductors; zinc compounds; ITO-laminated plastic substrate; InSnO; X-ray diffraction pattern; X-ray photoelectron spectroscopy; ZnO; chemical state; crystal; deposition; electronic nanodevices; elemental composition; films; hexamethylenetetramine solution; microphotograph; optical nanodevices; polyethylene terephthalate; surface roughness; temperature 95 degC; tip-nanorod morphology; x-ray reflection peaks; zinc nitrate hexahydrate; Optical control; Optical device fabrication; Optical films; Plastics; Polyethylene; Rough surfaces; Surface morphology; Surface roughness; X-ray diffraction; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4734608
Filename
4734608
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