• DocumentCode
    2145909
  • Title

    Post-synthesis sleep transistor insertion for leakage power optimization in clock tree networks

  • Author

    Homayoun, Houman ; Golshan, Shahin ; Bozorgzadeh, Eli ; Veidenbaum, Alex ; Kurdahi, Fadi J.

  • Author_Institution
    Center of Embedded Comput. Syst., Univ. of California, Irvine, CA, USA
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    499
  • Lastpage
    507
  • Abstract
    Leakage power has grown significantly and is a major challenge in SoC design. Among SoC´s components, clock distribution network power accounts for a large portion of chip power. In this paper, we propose to deploy sleep transistor insertion (STI) in the clock tree in order to reduce leakage power. We characterize the effect of sleep transistor sharing and sizing on clock tree wakeup time, leakage power, and propagation delay. We use these characteristics during leakage power optimization. We present post synthesis sleep transistor insertion (PSSTI), a heuristic clustering algorithm for sleep transistor insertion with the objective of total power minimization in a given clock tree. Sleep transistor sharing and sizing are deployed in order to meet the clock skew and wakeup delay constraints. We explored the potential benefits of STI using a standard industrial VLSI-CAD flow including sleep-transistor insertion and routing after clock synthesis and place-and-route of the benchmark circuits. Our results show that clock tree leakage power is reduced by 19%-32% depending on the topology of the synthesized clock tree.
  • Keywords
    VLSI; clocks; network routing; system-on-chip; VLSI-CAD flow; clock distribution network; clock tree networks; clock tree wakeup time; heuristic clustering algorithm; leakage power optimization; place-and-route; post-synthesis sleep transistor insertion; propagation delay; sleep transistor sharing; sleep transistor sizing; system-on-chip design; wakeup delay constraints; Circuit synthesis; Clocks; Clustering algorithms; Inverters; Minimization methods; Propagation delay; Random access memory; Sleep; Threshold voltage; Timing; Clock Tree; Sleep Transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450530
  • Filename
    5450530