DocumentCode
2145909
Title
Post-synthesis sleep transistor insertion for leakage power optimization in clock tree networks
Author
Homayoun, Houman ; Golshan, Shahin ; Bozorgzadeh, Eli ; Veidenbaum, Alex ; Kurdahi, Fadi J.
Author_Institution
Center of Embedded Comput. Syst., Univ. of California, Irvine, CA, USA
fYear
2010
fDate
22-24 March 2010
Firstpage
499
Lastpage
507
Abstract
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC´s components, clock distribution network power accounts for a large portion of chip power. In this paper, we propose to deploy sleep transistor insertion (STI) in the clock tree in order to reduce leakage power. We characterize the effect of sleep transistor sharing and sizing on clock tree wakeup time, leakage power, and propagation delay. We use these characteristics during leakage power optimization. We present post synthesis sleep transistor insertion (PSSTI), a heuristic clustering algorithm for sleep transistor insertion with the objective of total power minimization in a given clock tree. Sleep transistor sharing and sizing are deployed in order to meet the clock skew and wakeup delay constraints. We explored the potential benefits of STI using a standard industrial VLSI-CAD flow including sleep-transistor insertion and routing after clock synthesis and place-and-route of the benchmark circuits. Our results show that clock tree leakage power is reduced by 19%-32% depending on the topology of the synthesized clock tree.
Keywords
VLSI; clocks; network routing; system-on-chip; VLSI-CAD flow; clock distribution network; clock tree networks; clock tree wakeup time; heuristic clustering algorithm; leakage power optimization; place-and-route; post-synthesis sleep transistor insertion; propagation delay; sleep transistor sharing; sleep transistor sizing; system-on-chip design; wakeup delay constraints; Circuit synthesis; Clocks; Clustering algorithms; Inverters; Minimization methods; Propagation delay; Random access memory; Sleep; Threshold voltage; Timing; Clock Tree; Sleep Transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450530
Filename
5450530
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