DocumentCode
2146171
Title
A test cases generation method for FSM with counters and its fault coverage evaluation using a mutant generator
Author
Kohara, Masaru ; Higuchi, Masahiro ; Fujii, Mamoru
Author_Institution
Osaka Univ., Japan
Volume
2
fYear
1997
fDate
20-22 Aug 1997
Firstpage
555
Abstract
In this paper, we propose a test cases generation method for communication protocols modeled as finite-state machines (FSMs) with counters, which is a subclass of EFSM (extended finite-state machines). We also evaluate the fault coverage of the test suite generated by the proposed method. For evaluating the fault coverage, we suppose that the protocol specifications are implemented in C language and provide a restricted fault model in C language. We developed a mutant generator based on the fault models, and experimented with a sample protocol extracted from the OSI session protocol. An experiment shows that the test suite generated by our method detects faults of every mutant generated by the mutant generator
Keywords
C language; conformance testing; fault diagnosis; finite state machines; formal specification; open systems; program testing; protocols; telecommunication computing; C language; EFSM; FSM; OSI session protocol; communication protocols; counters; extended finite-state machines; fault coverage evaluation; finite-state machines; mutant generator; protocol specifications; restricted fault model; test cases generation method; test suite; Circuit faults; Circuit testing; Computer aided software engineering; Counting circuits; Electrical fault detection; Fault detection; Magnetic heads; Protocols; Registers; Tail;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Computers and Signal Processing, 1997. 10 Years PACRIM 1987-1997 - Networking the Pacific Rim. 1997 IEEE Pacific Rim Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-3905-3
Type
conf
DOI
10.1109/PACRIM.1997.620324
Filename
620324
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