• DocumentCode
    2146987
  • Title

    Multipath characteristics of impulse radio channels

  • Author

    Lee, Hojoon ; Han, Byungchil ; Shin, Yoan ; Im, Sungbin

  • Author_Institution
    Sch. of Electron. Eng., Soongsil Univ., Seoul, South Korea
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2487
  • Abstract
    We investigate the multipath characteristics of the impulse radios (IR) which have drawn much attention for future high-speed wireless communication services. For this objective, we observe the characteristics of bit error rates through computer simulations for the deterministic two-path model and the statistical indoor multipath model of Saleh and Valenzuela (1987). The simulation results indicate that the performance of the IR system depends on the time-delay differences between the multipath components, the path gains, the time interval in the PPM, and the reference signal waveform. It is also observed that the reference signal waveform used in the AWGN channel can not be applicable to the multipath channel
  • Keywords
    AWGN channels; delays; digital simulation; error statistics; indoor radio; multipath channels; pulse position modulation; statistical analysis; AWGN channel; PPM; bit error rates; computer simulations; deterministic two-path model; digital wireless communication systems; high-speed wireless communication services; impulse radio channels; impulse radio system performance; multipath channel; multipath characteristics; multipath components; path gains; reference signal waveform; simulation results; statistical indoor multipath model; time interval; time-delay differences; ultra wideband time hopping transmission; Bit error rate; Computational modeling; Computer simulation; Delay effects; Multipath channels; Performance gain; Pulse modulation; RAKE receivers; Spread spectrum communication; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
  • Conference_Location
    Tokyo
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-5718-3
  • Type

    conf

  • DOI
    10.1109/VETECS.2000.851720
  • Filename
    851720