• DocumentCode
    2147049
  • Title

    Percolation and dielectric breakdown

  • Author

    Kai, Wu ; Hengkun, Sie ; Jingpang, Ge

  • Author_Institution
    Dept. of Electr. Eng., Xi´´an Jiaotong Univ., China
  • Volume
    1
  • fYear
    1994
  • fDate
    3-8 Jul 1994
  • Firstpage
    49
  • Abstract
    A simple percolation model is put forward to give a qualitative analysis for intrinsic breakdown in insulating polymers. The electron´s migration in polymers should be electron hopping-conduction between localized states. When the electrical field is high enough so that electron´s hopping probability between localized states is increased to a threshold, the localized electron wave function will overlap to form a percolation path which corresponds to the extended state. Finally, breakdown will be induced by the electron multiplication process or Auger effect in the extended state
  • Keywords
    Bonding; Conductors; Dielectric breakdown; Electrons; Impurities; Insulation; Lattices; Polymers; Temperature; Wave functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
  • Conference_Location
    Brisbane, Qld.
  • Print_ISBN
    0-7803-1307-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.1994.413944
  • Filename
    413944