DocumentCode
2147119
Title
Intuitive ECO synthesis for high performance circuits
Author
Ren, Haoxing ; Puri, Ruchir ; Reddy, Lakshmi ; Krishnaswamy, Smita ; Washburn, Cindy ; Earl, Joel ; Keinert, Joachim
Author_Institution
IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
1002
Lastpage
1007
Abstract
In the IC industry, chip design cycles are becoming more compressed, while designs themselves are growing in complexity. These trends necessitate efficient methods to handle late-stage engineering change orders (ECOs) to the functional specification, often in response to errors discovered after much of the implementation is finished. Past ECO synthesis algorithms have typically treated ECOs as functional errors and applied error diagnosis techniques to solve them. However, error diagnosis methods are primarily geared towards finding a single change, and moreover, tend to be computationally complex. In this paper, we propose a unique methodology that can systematically incorporate human intuition into the ECO process. Our methodology involves finding a set of directly substitutable points known as functional correspondences between the original implementation and the new specification by using name-preserving synthesis and user hints, to diminish the size of the ECO problem. On average, our approach can reduce the size of logic changes by 94% from those reported in current literature. We then incorporate our logic ECO changes into an incremental physical synthesis flow to demonstrate its usability in an industrial setting. Our ECO synthesis methodology is evaluated on high-performance industrial designs. Results indicate that post-ECO worst negative slack (WNS) improved 14% and total negative slack (TNS) improved 46% over pre-ECO.
Keywords
Algorithm design and analysis; Error correction; Logic gates; Optimization; Runtime; Solid modeling; Timing; Engineering Change Order; Logic Synthesis; Physical Synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.209
Filename
6513655
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