• DocumentCode
    2147227
  • Title

    Analysis of the Pattern Evolution Based on Spatial Correlation and Fourier Spectra Technique

  • Author

    Dong, Lifang ; Yue, Han ; Xiao, Hong ; Yang, Yujie ; Wang, Shuai

  • Author_Institution
    Coll. of Phys. Sci. & Technol., Hebei Univ., Baoding, China
  • fYear
    2009
  • fDate
    17-19 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Images of patterns are processed with some image processing technology, such as binary image processing, space correlation function and Fourier transformation, thus some important intrinsic elements of active plasma and pattern formation can be presented more clearly. Images of random filaments, hexagonal, hexagonal superlattice pattern, and chaos state are obtained in dielectric barrier discharge system with increasing voltage. Using spatial correlation function, it is found that the average distance decreases with voltage increasing, and most hexagonal cells in both hexagonal and hexagonal superlattice pattern are relative perfect. For further investigation, these images are transformed to frequency domain and Fourier spectra are studied. It is found that the mode changes with voltage increasing. Both random filaments and chaos have single wavelength with all directions. The hexagonal pattern is formed with single-wavelength three-wave resonance, while hexagonal superlattice pattern is governed by three-wave resonance of two sets of modes.
  • Keywords
    Fourier transforms; correlation methods; frequency-domain analysis; image processing; Fourier spectra; Fourier transformation; active plasma; binary image processing; dielectric barrier discharge; frequency domain; hexagonal superlattice pattern; pattern evolution; pattern formation; pattern images; random filaments; space correlation function; three-wave resonance; Chaos; Dielectrics; Image processing; Pattern analysis; Pattern formation; Plasma materials processing; Resonance; Space technology; Superlattices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-4129-7
  • Electronic_ISBN
    978-1-4244-4131-0
  • Type

    conf

  • DOI
    10.1109/CISP.2009.5303792
  • Filename
    5303792