DocumentCode
2147227
Title
Analysis of the Pattern Evolution Based on Spatial Correlation and Fourier Spectra Technique
Author
Dong, Lifang ; Yue, Han ; Xiao, Hong ; Yang, Yujie ; Wang, Shuai
Author_Institution
Coll. of Phys. Sci. & Technol., Hebei Univ., Baoding, China
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
4
Abstract
Images of patterns are processed with some image processing technology, such as binary image processing, space correlation function and Fourier transformation, thus some important intrinsic elements of active plasma and pattern formation can be presented more clearly. Images of random filaments, hexagonal, hexagonal superlattice pattern, and chaos state are obtained in dielectric barrier discharge system with increasing voltage. Using spatial correlation function, it is found that the average distance decreases with voltage increasing, and most hexagonal cells in both hexagonal and hexagonal superlattice pattern are relative perfect. For further investigation, these images are transformed to frequency domain and Fourier spectra are studied. It is found that the mode changes with voltage increasing. Both random filaments and chaos have single wavelength with all directions. The hexagonal pattern is formed with single-wavelength three-wave resonance, while hexagonal superlattice pattern is governed by three-wave resonance of two sets of modes.
Keywords
Fourier transforms; correlation methods; frequency-domain analysis; image processing; Fourier spectra; Fourier transformation; active plasma; binary image processing; dielectric barrier discharge; frequency domain; hexagonal superlattice pattern; pattern evolution; pattern formation; pattern images; random filaments; space correlation function; three-wave resonance; Chaos; Dielectrics; Image processing; Pattern analysis; Pattern formation; Plasma materials processing; Resonance; Space technology; Superlattices; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5303792
Filename
5303792
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