• DocumentCode
    2147419
  • Title

    Fabrication and characteristics of ZnO-based thin film transistors

  • Author

    Han, Dedong ; Wang, Yi ; Zhang, Shengdong ; Sun, Lei ; Kang, Jinfeng ; Liu, Xiaoyan ; Du, Gang ; Liu, Lifeng ; Han, Ruqi

  • Author_Institution
    Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Beijing, China
  • fYear
    2008
  • fDate
    20-23 Oct. 2008
  • Firstpage
    982
  • Lastpage
    984
  • Abstract
    ZnO-based thin-film transistors (TFT) have been fabricated on p-Si (100) substrates by radio frequency (rf) magnetron sputtering at room temperature with a bottom gate configuration. The XRD and SEM show that ZnO films had high crystalline quality. The ZnO films present an average optical transmission (including the glass substrate) of 80% in the visible part of the spectrum. The electrical properties of ZnO-based TFTs were investigated by ID-VD and ID-VG measurements. The ZnO TFT operates in the enhancement mode with a channel mobility of 6.86 cm2/V · s. The combination of transparency, high channel mobility and room temperature processing makes the ZnO-TFT a very promising low cost optoelectronic device for the next generation of flat panel display (FDP).
  • Keywords
    II-VI semiconductors; X-ray diffraction; characteristics measurement; flat panel displays; optoelectronic devices; scanning electron microscopy; semiconductor device measurement; semiconductor thin films; silicon; sputtered coatings; thin film transistors; wide band gap semiconductors; zinc compounds; FDP; ID-VD measurement; ID-VG measurement; SEM; Si; TFT; XRD; ZnO; bottom gate configuration; channel mobility; flat panel display; optical transmission; optoelectronic device; radio frequency magnetron sputtering; temperature 293 K to 298 K; thin film transistor fabrication; Crystallization; Fabrication; Optical films; Radio frequency; Sputtering; Substrates; Temperature; Thin film transistors; X-ray scattering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2185-5
  • Electronic_ISBN
    978-1-4244-2186-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734708
  • Filename
    4734708