On the rigorous calculation of all ohmic losses in rectangular waveguide multi-port junctions

In this paper, all ohmic losses effects present in rectangular waveguide multi-port junctions are rigorous and efficiently computed. For this purpose, a formulation based on the theory of cavities, which provides generalized admittance matrix representations for such junctions, is proposed. To validate this theory, we have successfully compared our results with numerical data of a lossy E-plane T-junction and of a hollow waveguide, as well as with experimental measurements of a real H-plane T-junction.