• DocumentCode
    2149603
  • Title

    Static, Dynamic, and Application-Level SEE Results for a 49-Core RHBD Processor

  • Author

    Wie, B. ; Plante, M.K. ; Berkley, Andrew ; Guertin, Steven M. ; Nejad, R.J.

  • Author_Institution
    Integrity Applic. Inc., Chantilly, VA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Recent dynamic and static results are presented on a 49-core RHBD processor. Dynamic cache results show increased SEE susceptibility over static tests. Application level testing shows good correlation to low level cache results.
  • Keywords
    cache storage; microprocessor chips; multiprocessing systems; radiation hardening (electronics); semiconductor device testing; 49-core RHBD processor; SEE susceptibility; application level testing; dynamic cache results; low level cache results; static results; Image coding; Registers; Software; Testing; Tiles; Transform coding; Virtual machine monitors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658217
  • Filename
    6658217
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149603